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The scanning electron microscope offers new techniques for the diagramming diagnostic characters on insects
Authors
E. F. LegnerM. Kogan
Authors Affiliations
E. F. Legner is Associate Entomologist, Division of Biological Control, University of California, Riverside; M. Kogan is Associate Entomologist, Illinois Natural History Survey, University of Illinois, Urbana.Publication Information
Hilgardia 23(9):4-5. DOI:10.3733/ca.v023n09p4. September 1969.
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Abstract
The remarkable high resolution, and three-dimensional clarity of the new scanning electron microscopes are giving researchers their first accurate view of many minute insect parts—an advance comparable with the change from a magnifying glass to a conventional microscope.
Legner E, Kogan M. 1969. The scanning electron microscope offers new techniques for the diagramming diagnostic characters on insects. Hilgardia 23(9):4-5. DOI:10.3733/ca.v023n09p4
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